| 标题 |
Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopy |
| 网址 | |
| DOI |
10.7498/aps.58.8008
doi
|
| 其它 |
期刊:Acta Physica Sinica 作者:Liu Xue-Qin; Han Guo-Jian; Huang Chun-Kui; Lan Wei 出版日期:2009-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)