| 标题 |
Simulation of Grazing-Incidence Synchrotron White Beam X-ray Topographic Images of Micropipes in 4H-SiC and Determination of Their Dislocation Senses |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Electronic Materials 作者:Yi Chen; Michael Dudley; Edward K. Sanchez; Michael F. MacMillan 出版日期:2007-11-13 |
| 求助人 | |
| 下载 |
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(2025-6-4)