| 标题 |
Simulation of Grazing-Incidence Synchrotron White Beam X-ray Topographic Images of Micropipes in 4H-SiC and Determination of Their Dislocation Senses |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Electronic Materials 作者:Yi Chen; Michael Dudley; Edward K. Sanchez; Michael F. MacMillan 出版日期:2007-11-13 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)