| 标题 |
The CORE Sequence: A Nanoscale Fluorocarbon-Free Silicon Plasma Etch Process Based on SF6/O2 Cycles with Excellent 3D Profile Control at Room Temperature |
| 网址 | |
| DOI | |
| 其它 |
期刊:ECS Journal of Solid State Science and Technology 作者:Vy Thi Hoang Nguyen; Chantal Silvestre; Peixiong Shi; Roy Cork; Flemming Jensen; et al 出版日期:2020 |
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(2025-6-4)