| 标题 |
[高分]
Ultra-low energy radical treatments for advanced 3D device structures |
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| DOI | |
| 其它 |
期刊:Advanced Etch Technology and Process Integration for Nanopatterning XII 作者:Seung Park; Yong Hee Choi; David Lo; Mark Kawaguchi; Christine Das 出版日期:2023-08-01 |
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(2025-6-4)