| 标题 |
Dynamic Cross Characterization Network for Few-Shot IC Package Substrates Surface Defect Segmentation |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Industrial Informatics 作者:Haoyuan Li; Ruiyun Yu; Bingyang Guo 出版日期:2026-01-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)