| 标题 |
Experimental determination of residual stress in silicon nitride diffusion bonds obtained by high-energy X-ray diffraction |
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| DOI | |
| 其它 |
期刊:Powder Technology 作者:M. Vila; M.L. Martínez; C. Prieto; P. Miranzo; M.I. Osendi; et al 出版日期:2004-10-01 |
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(2025-6-4)