| 标题 |
A Dual-Si Atomic Precursor Enabling High-Quality SiN x Thin Films via Very High-Frequency Plasma Atomic Layer Deposition |
| 网址 | |
| DOI | |
| 其它 |
期刊:Chemistry of Materials 作者:Young-Jin Lim; Yujin Lee; Kim-Hue Thi Dinh; Min-Jeong Rhee; Yea-Ji Kim; et al 出版日期:2026-05-16 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)