| 标题 |
Evolution of Structural, Optical, and Electrical Properties of Amorphous Silicon Thin Films Deposited by Radio Frequency Magnetron Sputtering |
| 网址 | |
| DOI | |
| 其它 |
期刊:Surface and Interface Analysis 作者:Wei Qiang Li; Peng Fei Ji; Yong Li; Yue Li Song; Feng Qun Zhou 出版日期:2026-08-24 |
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(2025-6-4)