| 标题 |
Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions |
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| 其它 |
期刊: IEEE Transactions on Applied Superconductivity 作者:Evan B. Golden; Neel Parmar; Vasili K. Semenov; Sergey K. Tolpygo Lincoln Laboratory; M. I. O. Technology; et al 出版日期:2025-01-06 |
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(2025-6-4)