| 标题 |
Growth and characterization of SiGe/Si superlattice for vertically stacked DRAM |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Materials Science: Materials in Electronics 作者:Hailing Wang; Xiangsheng Wang; Yanpeng Song; Xiaomeng Liu; Ying Zhang; et al 出版日期:2025-01-01 |
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(2025-6-4)