| 标题 |
Characterization of the three-dimensional residual stress distribution in SiC bulk crystals by neutron diffraction |
| 网址 | |
| DOI | |
| 其它 |
期刊:CrystEngComm 作者:Xuejian Xie; Xiaobo Hu; Xiufang Chen; Fafu Liu; Xianglong Yang; et al 出版日期:2017-10-18 |
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(2025-6-4)