| 标题 |
Small-Sample Fault Diagnosis for SOFC Systems Based on the Maximum Information Coefficient and VAE-GAN |
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| 其它 |
期刊:2026 41st Youth Academic Annual Conference of Chinese Association of Automation (YAC) 作者:Jian Shen; Yi Shu; Bin Ma; Wei Guo; Ye Cao; et al 出版日期:2026-05-01 |
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(2025-6-4)