| 标题 |
Location and reliability problems on a line: Impact of objectives and correlated failures on optimal location patterns |
| 网址 | |
| DOI | |
| 其它 |
期刊:Omega 作者:Oded Berman; Dmitry Krass; Mozart B.C. Menezes 出版日期:2012-10-11 |
| 求助人 | |
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(2025-6-4)