| 标题 |
Poly-dimethyl-siloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Surface Science 作者:U Oran; E Ünveren; T Wirth; W.E.S Unger 出版日期:2004-01-17 |
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(2025-6-4)