| 标题 |
Electromigration Behavior of Sn-3.5Ag Solder Joints with (110) and (111) Nanotwinned Cu UBMs |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Conference on Electronic Packaging Technology 作者:Yanyan Zhang; Shinan Zhang; Jing Ren; Feifei Huang; Mingliang Huang 出版日期:2024-08-07 |
| 求助人 | |
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(2025-6-4)