| 标题 |
First Experimental Demonstration of Monolithically Stacked FeRAM with Dual-Gate Poly-Si Access Transistors and Horizontal Ferroelectric Capacitors |
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| DOI | |
| 其它 |
期刊:2025 IEEE International Electron Devices Meeting (IEDM) 作者:Huihui Li; Yali Tan; Zihao Yuan; Zean Guo; Chen Yang; et al 出版日期:2026-01-31 |
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(2025-6-4)