| 标题 |
Exploring proximity effects and large depth of field in helium ion beam lithography: large-area dense patterns and tilted surface exposure |
| 网址 | |
| DOI | |
| 其它 |
期刊:Nanotechnology 作者:Ranveig Flatabø; Akshay Agarwal; Richard Hobbs; Martin M Greve; Bodil Holst; Karl K Berggren 出版日期:2018 |
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(2025-6-4)