| 标题 |
Ionic migrations during poling process in lanthanum aluminate investigated by time of flight-secondary ions mass spectrometry and piezoresponse force microscopy combined methodology |
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| 其它 |
期刊:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 作者:Maiglid A. Moreno; Nicolas Chevalier; Jean-Paul Barnes; Brice Gautier 出版日期:2020-04-03 |
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(2025-6-4)