| 标题 |
Investigation into the performance and surge current robustness of 1200V SiC MOSFETs with different JFET doping designs |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Yuhan Duan; Jiuyang Tang; Pan Liu; Qingchun Jon Zhang 出版日期:2025-06-23 |
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(2025-6-4)