| 标题 |
MARS: A Multiscale Ab Initio Reliability Simulator for Advanced Si and 2D Material Based MOSFETs |
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| DOI | |
| 其它 |
期刊:2024 IEEE International Electron Devices Meeting (IEDM) 作者:Yue-Yang Liu; Guang-Hua Xu; Tao Xiong; Wen-Feng Li; Yu Zhao; et al 出版日期:2024-12-07 |
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(2025-6-4)