| 标题 |
Thickness dependence of phase-formation behavior and polarization properties in ferroelectric films of the binary HfO 2 –ZrO 2 system fabricated via chemical solution deposition |
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| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Hiroshi Uchida; Ryohei Okamoto; Takuma Ito; Yukie Yokota; Hiromi Shima; et al 出版日期:2026-08-14 |
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(2025-6-4)