| 标题 |
A critical review on performance, reliability, and fabrication challenges in nanosheet FET for future analog/digital IC applications |
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| DOI | |
| 其它 |
期刊:Micro and nanostructures 作者:Sresta Valasa; Shubham Tayal; Laxman Raju Thoutam; J. Ajayan; Sandip Bhattacharya 出版日期:2022-08-28 |
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(2025-6-4)