| 标题 |
Molecular Layer Deposited Aluminum‐Based Hybrid Resist for High‐Resolution Nanolithography and Direct Ultra‐High Aspect Ratio Pattern Transfer |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Materials Technologies 作者:Won‐Il Lee; Dan N. Le; Matthew Yen; Melinda Lin; Ashwanth Subramanian; et al 出版日期:2025-11-26 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)