| 标题 |
Electrical failure and damage analysis of multi-layer metal films on flexible substrate during cyclic bending deformation |
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| DOI | |
| 其它 |
期刊:18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 作者:Byoung-Joon Kim; Hae-A-Seul Shin; In-Suk Choi; Young-Chang Joo 出版日期:2011-07-01 |
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(2025-6-4)