| 标题 |
Influence of Edge Crack Propagation on Critical Current Degradation of REBCO Tape Studied by Phase-Field Fracture Method and Current Shunting Model |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Applied Superconductivity 作者:Zhaofei Jiang; Yiqun Huang; Donghui Jiang; Wenge Chen; Guangli Kuang 出版日期:2023 |
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(2025-6-4)