| 标题 |
Physical Failure Analysis of Dielectric Breakdown Induced Metal Migration in LDMOS |
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| DOI | |
| 其它 |
期刊:2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 作者:Jialu Huang; Chao Yan; Jingming Zhou; Kai Wang; Xing Wu 出版日期:2025 |
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(2025-6-4)