| 标题 |
Formation mechanisms of low-density C-related defects in homoepitaxy 3C-SiC MOS capacitors compared with 4H-SiC 同质外延3C-SiC MOS电容器与4H-SiC低密度C相关缺陷形成机制的比较
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| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Zheng Hu; Yidan Tang; Huaping Song; Xinhua Wang; Junwei Yang; et al 出版日期:2025-11-12 |
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