| 标题 |
Effect of hydrogen incorporation on sub-gap density of states in amorphous InGaZnO thin-film transistors |
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| 其它 |
期刊:Oxide-based Materials and Devices XI 作者:George W. Mattson; Kyle T. Vogt; Chris Malmberg; Paul Cheong; John F. Wager; Matt W. Graham 出版日期:2020-03-06 |
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(2025-6-4)