| 标题 |
Decoupling of the thermal and electrical damage effects for electronic devices induced by products of new active material projectile high-speed impacting on the aluminum plate |
| 网址 | |
| DOI | |
| 其它 |
期刊:Measurement 作者:Enling Tang; Naijin Xing; Yafei Han; Chuang Chen; Mengzhou Chang; et al 出版日期:2025-04-17 |
| 求助人 | |
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(2025-6-4)