| 标题 |
Study on the impact of corner rounding and line-end shortening on charging effects in plasma etching |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B 作者:Peng Zhang; Huihui Chen; Jiaqi Sha; Mengyuan Tang 出版日期:2025-08-27 |
| 求助人 | |
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(2025-6-4)