| 标题 |
Effect of film thickness and temperature on the resistive switching characteristics of the Pt/HfO2/Al2O3/TiN structure |
| 网址 | |
| DOI | |
| 其它 |
期刊:Solid-State Electronics 作者:Yulin Liu; Sha Ouyang; Jie Yang; Minghua Tang; Wei Wang; et al 出版日期:2020-11-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)