| 标题 |
Origin of Dark Current Robustness in Photomultiplication Organic Photodetectors Enabled by Ionic Conjugated Electron‐Blocking Layers |
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| DOI | |
| 其它 |
期刊:Advanced Materials 作者:Yelim Kang; Min Hun Jee; Shuai Zhang; Sang Heon Lee; Jung Min Ha; et al 出版日期:2026-07-30 |
| 求助人 | |
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(2025-6-4)