| 标题 |
First demonstration of DG monolayer MoS 2 FETs with 0.3 nm-thin contact extensions achieving near immunity to SCEs at L CH =20 nm and g m =206 μS/μm |
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| DOI | |
| 其它 |
期刊:2025 IEEE International Electron Devices Meeting (IEDM) 作者:Jun Cai; Hao-Yu Lan; Yuanqiu Tan; Zhihong Chen; Joerg Appenzeller 出版日期:2026-01-31 |
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(2025-6-4)