| 标题 |
Investigation of Reverse Recovery Failure Mechanism in SJ MOSFET with Increasing Rg |
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| DOI | |
| 其它 |
期刊:2025 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 作者:Jieun Lee; Jong Min Kim; Young Chul Kim; Won Kook Cho; Hyunchul Nah; Sang Gi Lee 出版日期:2025 |
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(2025-6-4)