| 标题 |
Self-Supervised CLIP-Guided for Few-Shot Industrial Anomaly Detection |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Instrumentation and Measurement 作者:Yingwen Chen; Ying Xu; Tianlei Wang; Yikui Zhai; Kanghong Tan; et al 出版日期:2026-01-01 |
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(2025-6-4)