| 标题 |
Line-edge-roughness transfer during plasma etching: modeling approaches and comparison with experimental results |
| 网址 | |
| DOI |
10.1117/1.3268365
doi
|
| 其它 |
期刊:Journal of Micro/Nanolithography, MEMS, and MOEMS 作者:Vassilios Constantoudis 出版日期:2009-10-01 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)