| 标题 |
The dark side of artificial intelligence: An empirical study of AI-induced technostress and defensive work behaviors
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| DOI |
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| 其它 | Strich, F., Mayer, A. S., & Fiedler, M. (2021). The dark side of artificial intelligence: An empirical study of AI-induced technostress and defensive work behaviors. Journal of Strategic Information Systems, 30(4), 101688. |
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