| 标题 |
Interface and oxide trap states of SiO2/GaN metal–oxide–semiconductor capacitors and their effects on electrical properties evaluated by deep level transient spectroscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Shingo Ogawa; Hidetoshi Mizobata; Takuma Kobayashi; Takayoshi Shimura; Heiji Watanabe 出版日期:2023 |
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(2025-6-4)