Lv5
1310 积分 2025-07-01 加入
Origin of threshold voltage instability in vertical GaN trench MOSFETs characterized by charge pumping
10天前
已完结
Post-trench restoration for vertical GaN power devices
10天前
已完结
Study of interface trap density of AlOxNy/GaN MOS structures
1个月前
已完结
Vertical Al2O3/GaN MOS capacitors with PEALD-GaOx interlayer passivation
1个月前
已完结
Deep-level-transient-spectroscopy study on electron traps near GaN surface generated by sputter deposition of SiO2
2个月前
已完结
Interface and oxide trap states of SiO2/GaN metal–oxide–semiconductor capacitors and their effects on electrical properties evaluated by deep level transient spectroscopy
2个月前
已完结
Effects of pre-deposition annealing prior to gate insulator deposition in planar AlGaN/GaN MIS-HEMT with a thin AlGaN barrier layer
2个月前
已关闭
ALD-derived high-k ZrAlOx dielectrics for boosted performance of CNTs/ZTO CMOS inverter
2个月前
已完结
Identification of the defect dominating high temperature reverse leakage current in vertical GaN power diodes through deep level transient spectroscopy
2个月前
已完结
Study and characterization of GaN MOS capacitors: Planar vs trench topographies
2个月前
已完结
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