| 标题 |
Polarity Reversal of Dipole at the SiO2/HZO Interface in Ferroelectric Field-Effect Transistors by Oxygen Scavenging of TiN |
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| DOI | |
| 其它 |
期刊:ACS Applied Electronic Materials 作者:Manru Gong; Lixing Zhou; Xiaolei Wang; Junshuai Chai; Shuaijie Rong; et al 出版日期:2026-09-09 |
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(2025-6-4)