| 标题 |
Advanced in situ pre-Ni silicide (Siconi) cleaning at 65nm to resolve defects in NiSix modules |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 作者:Ruipeng Yang; Na Su; Paolo Bonfanti; Jiaxiang Nie; Jay Ning; et al 出版日期:2010-01-01 |
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(2025-6-4)