| 标题 |
Secondary defects of as-grown oxygen precipitates in nitrogen doped Czochralski single crystal silicon |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Huan Tuo; Yun Liu; Minghao Li; Rongwang Dai; Hao Wang; et al 出版日期:2023-05-09 |
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(2025-6-4)