| 标题 |
Polarization-modulated attenuated total-internal reflection infrared spectroscopic study of surfaces: An application to the aging of oxide films on silicon plates |
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| DOI | |
| 其它 |
期刊:The Journal of Physical Chemistry 作者:Kerin Scanlon; Richard J. Kvitek; Suellen F. Schulthesz; John F. Evans; John Overend 出版日期:1983-03-01 |
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(2025-6-4)