| 标题 |
Fundamental understanding of exposure and process chemistry of Sn-based metal oxide resists: effects of ambient environment during post-exposure delay and bake |
| 网址 | |
| DOI |
10.1117/1.jmm.25.1.014601
doi
|
| 其它 |
期刊:Journal of micro/nanopatterning, materials, and metrology 作者:Ivan Pollentier; Fabian Holzmeier; Roberto Fallica; Ying-Lin Chen; Dhirendra P. Singh; et al 出版日期:2026-02-24 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
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(2025-6-4)