| 标题 |
Computer Vision and Machine Learning Techniques for Optical Micrograph Defect Classification Using a Novel Gray Thresholding Technique |
| 网址 | |
| DOI | |
| 其它 |
期刊:Integrating Materials and Manufacturing Innovation 作者:C. R. Hasbrouck; Simon W. Miller; Jay Martin 出版日期:2026-08-13 |
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(2025-6-4)