| 标题 |
Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics B 作者:Haixin Zhang; Yunfei Li; Hao Chang; Yu Yu; Gong Wang; et al 出版日期:2025-03-28 |
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(2025-6-4)