| 标题 |
Revised CV characterization technique for interface state evaluation in SiN/n-GaN MIS capacitors: Effects of extraction time, temperature and UV illumination |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:A.M. Hofer; C. Koller; N. Modolo; D. Pogany; C. Ostermaier 出版日期:2025 |
| 求助人 | |
| 下载 |
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(2025-6-4)