| 标题 |
 Research on Failure Mechanism of High Temperature Reverse Bias Test for Power VDMOS |
| 网址 | |
| DOI | |
| 其它 |
期刊：2024 15th International Conference on Reliability, Maintenance and Safety (ICRMS) 作者：Danyang Zhang; Yanfei Zhang; Mengxin Liu; Xiaoxia Wen; Ge Zhao 出版日期：2025-12-04 |
| 求助人 | |
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(2025-6-4)
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