| 标题 |
Investigation on the Degradation Mechanism for GaN Cascode Device Under Repetitive Hard-Switching Stress |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Power Electronics 作者:Chi Zhang; Siyang Liu; Sheng Li; Yanfeng Ma; Weihao Lu; et al 出版日期:2021-11-08 |
| 求助人 | |
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(2025-6-4)