| 标题 |
Atomic‐Layer‐Deposited Al 2 O 3 as Effective Barrier against the Diffusion of Hydrogen from SiN x :H Layers into Crystalline Silicon during Rapid Thermal Annealing |
| 网址 | |
| DOI | |
| 其它 |
期刊:physica status solidi (RRL) – Rapid Research Letters 作者:Lailah Helmich; Dominic C. Walter; Dennis Bredemeier; Jan Schmidt 出版日期:2020-09-22 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)